Spatial Resolution in the Atom Probe Field Ion Microscope
نویسندگان
چکیده
منابع مشابه
A Time-of-flight Atom-probe Field-ion Microscope for the Study of Defects in Metals
An ultra-high vacuum time-of-flight (TOF) atom-probe field-ion microscope (FIM) specifically designed for the study of defects in metals is described. Performance experiments show that this instrument can clearly resolve the seven stable isotopes of molybdenum, the five stable isotopes of tungsten, and the two stable isotopes of rhenium in a tungsten-25at.% rhenium alloy. The entire process of ...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 1997
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927600012836